Publication detail

A new program for the design of electron microscopes

LENCOVÁ, B. ZLÁMAL, J.

Original Title

Type

journal article - other

Language

English

Original Abstract

The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.

Keywords

Finite element method; Electron lenses and deflectors; Computer-aided design; User interface

Authors

LENCOVÁ, B.; ZLÁMAL, J.

RIV year

2008

Released

29. 8. 2008

Publisher

Elsevier

ISBN

1875-3892

Periodical

Physics Procedia

Year of study

Number

State

Kingdom of the Netherlands

Pages from

315

Pages to

324

Pages count

BibTex

@article{BUT48562,
  author="Bohumila {Lencová} and Jakub {Zlámal}",
  title="A new program for the design of electron microscopes",
  journal="Physics Procedia",
  year="2008",
  volume="1",
  number="1",
  pages="315--324",
  issn="1875-3892"
}