Detail publikace

A new program for the design of electron microscopes

LENCOVÁ, B. ZLÁMAL, J.

Originální název

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.

Klíčová slova

Finite element method; Electron lenses and deflectors; Computer-aided design; User interface

Autoři

LENCOVÁ, B.; ZLÁMAL, J.

Rok RIV

2008

Vydáno

29. 8. 2008

Nakladatel

Elsevier

ISSN

1875-3892

Periodikum

Physics Procedia

Ročník

Číslo

Stát

Nizozemsko

Strany od

315

Strany do

324

Strany počet

BibTex

@article{BUT48562,
  author="Bohumila {Lencová} and Jakub {Zlámal}",
  title="A new program for the design of electron microscopes",
  journal="Physics Procedia",
  year="2008",
  volume="1",
  number="1",
  pages="315--324",
  issn="1875-3892"
}