Publication detail
A study on the thickness homogeneity and refractive index of thin organic layers
ZMEŠKAL, O. SALYK, O. VESELÝ, M. DZIK, P.
Original Title
A study on the thickness homogeneity and refractive index of thin organic layers
Type
journal article - other
Language
English
Original Abstract
This paper deals with the utilization of optical and interference microscopy for the study of thin film layers.
Keywords
refractive index, thickness of layers, interefernce microscopy, optical microscopy
Authors
ZMEŠKAL, O.; SALYK, O.; VESELÝ, M.; DZIK, P.
RIV year
2008
Released
9. 9. 2008
Publisher
Asociace českých chemických společností
Location
Brno
ISBN
1213-7103
Periodical
Chemické listy
Year of study
102
Number
S
State
Czech Republic
Pages from
s1033
Pages to
s1036
Pages count
4