Publication detail

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

SCHMIEDOVÁ, V. HEINRICHOVÁ, P. ZMEŠKAL, O. WEITER, M.

Original Title

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

Type

journal article in Web of Science

Language

English

Original Abstract

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.

Keywords

Organic materials; spectroscopic ellipsometry; solar cells; UV-VIS absorption; profilometry

Authors

SCHMIEDOVÁ, V.; HEINRICHOVÁ, P.; ZMEŠKAL, O.; WEITER, M.

RIV year

2015

Released

15. 9. 2015

Publisher

Applied surface science

Location

North-Holland

ISBN

0169-4332

Periodical

Applied Surface Science

Year of study

349

Number

10

State

Kingdom of the Netherlands

Pages from

582

Pages to

588

Pages count

7

URL

http://www.sciencedirect.com/science/article/pii/S0169433215011253

BibTex

@article{BUT114511,
  author="Veronika {Schmiedová} and Patricie {Heinrichová} and Oldřich {Zmeškal} and Martin {Weiter}",
  title="Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry",
  journal="Applied Surface Science",
  year="2015",
  volume="349",
  number="10",
  pages="582--588",
  doi="10.1016/j.apsusc.2015.05.027",
  issn="0169-4332",
  url="http://www.sciencedirect.com/science/article/pii/S0169433215011253"
}