Detail publikace

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

SCHMIEDOVÁ, V. HEINRICHOVÁ, P. ZMEŠKAL, O. WEITER, M.

Originální název

Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This contribution deals with a study on the optical characterization of p-conjugated polymer thin films. There is summary of the thicknesses and the optical properties of researched organic materials such as MDMO-PPV, PCBTDPP, PC60BM, PCDTBT and PC70BM as a potential candidates for optoelectronic applications (OPV, OLED and other). Multi-instrument characterization of the optical properties organic photovoltaic thin films using spestroscopic ellipsometry, UV-VIS spectrophotometry and profilometry.

Klíčová slova

Organic materials; spectroscopic ellipsometry; solar cells; UV-VIS absorption; profilometry

Autoři

SCHMIEDOVÁ, V.; HEINRICHOVÁ, P.; ZMEŠKAL, O.; WEITER, M.

Rok RIV

2015

Vydáno

15. 9. 2015

Nakladatel

Applied surface science

Místo

North-Holland

ISSN

0169-4332

Periodikum

Applied Surface Science

Ročník

349

Číslo

10

Stát

Nizozemsko

Strany od

582

Strany do

588

Strany počet

7

URL

http://www.sciencedirect.com/science/article/pii/S0169433215011253

BibTex

@article{BUT114511,
  author="Veronika {Schmiedová} and Patricie {Heinrichová} and Oldřich {Zmeškal} and Martin {Weiter}",
  title="Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry",
  journal="Applied Surface Science",
  year="2015",
  volume="349",
  number="10",
  pages="582--588",
  doi="10.1016/j.apsusc.2015.05.027",
  issn="0169-4332",
  url="http://www.sciencedirect.com/science/article/pii/S0169433215011253"
}