Physical Propertie of Plasmatic and Evaporated Polysilylenes

conference proceedings

English

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

polysilane, electroluminescence

SALYK, O., HORVÁTH, P., WEITER, M., SCHAUER, F.

1998

1. 1. 1998

Ústav fyziky SAV

Bratislava

24

24

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