Publication detail
Oriented Thin Films of Polysilylenes and their Properties
SALYK, O., KUŘITKA, I., WEITER, M., SCHAUER, F.
Original Title
Oriented Thin Films of Polysilylenes and their Properties
Type
conference paper
Language
English
Original Abstract
Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.
Key words in English
polysilane, luminescence, absorption, infrared spectra
Authors
SALYK, O., KUŘITKA, I., WEITER, M., SCHAUER, F.
RIV year
2001
Released
1. 1. 2001
Publisher
Brno University of Technology, Faculty of Chemistry
Location
Brno
ISBN
80-214-1893-1
Book
Proceedings of the Workshop Electronic Properties of Molecular Materials and Functional Polymers of EU programme COST 518 Molecular Materials and Functional Polymers for Advanced Devices
Pages from
168
Pages to
176
Pages count
9
URL
x
BibTex
@inproceedings{BUT2876,
author="Ota {Salyk} and Ivo {Kuřitka} and Martin {Weiter} and František {Schauer}",
title="Oriented Thin Films of Polysilylenes and their Properties",
booktitle="Proceedings of the Workshop Electronic Properties of Molecular Materials and Functional Polymers of EU programme COST 518 Molecular Materials and Functional Polymers for Advanced Devices",
year="2001",
pages="9",
publisher="Brno University of Technology, Faculty of Chemistry",
address="Brno",
isbn="80-214-1893-1",
url="x"
}