Publication detail

New Scratch Tester Developed for Plasma Polymer Characterization

PŘIKRYL, R., SALYK, O., KŘÍPAL, L., ČECH, V.

Original Title

Type

journal article - other

Language

English

Original Abstract

A fully PC-controlled scratch tester was developed for testing of adhesion between the film and the substrate. The Rockwell ball or the diamond tip is driven over the film surface to produce a scratch in this film. The load on the ball (tip) is linearly increased and the value of the load, at which adhesion failure is detected, is known as the critical load between the film and the substrate. The apparatus was constructed and optimized for polymer films with respect to the force range and sensitivity. The plot of normal and lateral force is recorded and analyzed in order to obtain the critical load value. The optical polarizing and the atomic force microscopy enabled to analyze the scratch path.

Key words in English

adhesion, scratch, thin film, plasma polymer

Authors

PŘIKRYL, R., SALYK, O., KŘÍPAL, L., ČECH, V.

Released

1. 1. 2002

ISBN

0011-4626

Periodical

Czechoslovak Journal of Physics

Year of study

2002

Number

52 D (2002)

State

Czech Republic

Pages from

824

Pages to

828

Pages count

BibTex

@article{BUT41222,
  author="Radek {Přikryl} and Ota {Salyk} and Lukáš {Křípal} and Vladimír {Čech}",
  title="New Scratch Tester Developed for Plasma Polymer Characterization",
  journal="Czechoslovak Journal of Physics",
  year="2002",
  volume="2002",
  number="52 D (2002)",
  pages="5",
  issn="0011-4626"
}