Publication detail
Optimized Impedance Measurement with AD5933
EHLICH, J. ZHIVKOV, I. YORDANOV, R. SALYK, O. WEITER, M.
Original Title
Optimized Impedance Measurement with AD5933
Type
conference paper
Language
English
Original Abstract
The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.
Keywords
Impedance, AD5933, analog frontend
Authors
EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.
Released
14. 5. 2020
Publisher
International Spring Seminar on Electronics Technology
Location
Slovakia
ISBN
9781728167732
Book
Proceedings of the International Spring Seminar on Electronics Technology
Edition
May 2020
Pages from
1
Pages to
6
Pages count
6
URL
BibTex
@inproceedings{BUT164754,
author="EHLICH, J. and ZHIVKOV, I. and YORDANOV, R. and SALYK, O. and WEITER, M.",
title="Optimized Impedance Measurement with AD5933",
booktitle="Proceedings of the International Spring Seminar on Electronics Technology",
year="2020",
series="May 2020",
pages="1--6",
publisher="International Spring Seminar on Electronics Technology",
address="Slovakia",
doi="10.1109/ISSE49702.2020.9121159",
isbn="9781728167732",
url="https://ieeexplore.ieee.org/document/9121159"
}