Publication detail
High resolution measuring with X-ray computed tomography
BŘÍNEK, A. TESAŘOVÁ, M. ZIKMUND, T. KAISER, J.
Original Title
High resolution measuring with X-ray computed tomography
Type
conference paper
Language
English
Original Abstract
The ability to inspect the interior of an object in a nondestructive was is of fundamental importance in a wide range of academic and industrial applications, raging from life science research, to medical diagnosis. X-ray tomography provides a tool to obtain 3D image of the object computed by the reconstruction algorithm. In recent years, significant progress has been made in the field of advanced X-ray computed tomography (CT) imaging, pushing the limit of voxel resolution far beyond 1 micrometer. On the four samples are shown the possibilities of achieved resolutions.
Keywords
X-ray computed tomography, high resolution measuring,
Authors
BŘÍNEK, A.; TESAŘOVÁ, M.; ZIKMUND, T.; KAISER, J.
Released
20. 4. 2017
Location
Telč
ISBN
9788021085503
Book
Book of Abstracts CEITEC PhD Retreat II
Pages from
69
Pages to
69
Pages count
138
BibTex
@inproceedings{BUT137872,
author="Adam {Břínek} and Markéta {Kaiser} and Tomáš {Zikmund} and Jozef {Kaiser}",
title="High resolution measuring with X-ray computed tomography",
booktitle="Book of Abstracts CEITEC PhD Retreat II",
year="2017",
pages="69--69",
address="Telč",
isbn="9788021085503"
}