Detail publikace

High resolution time-of-flight low energy ion scattering

DRAXLER, M. MARKIN, S. KOLÍBAL, M. PRŮŠA, S. ŠIKOLA, T. BAUER, P.

Originální název

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

Klíčová slova

High resolution; TOF; LEIS; He; Cu

Autoři

DRAXLER, M.; MARKIN, S.; KOLÍBAL, M.; PRŮŠA, S.; ŠIKOLA, T.; BAUER, P.

Rok RIV

2005

Vydáno

15. 4. 2005

Nakladatel

Elsevier

ISSN

0168-583X

Periodikum

Nuclear Instruments and Methods in Physics Research B

Ročník

230

Stát

Nizozemsko

Strany od

398

Strany do

401

Strany počet

BibTex

@article{BUT45588,
  author="M. {Draxler} and S. N. {Markin} and Miroslav {Kolíbal} and Stanislav {Průša} and Tomáš {Šikola} and P. {Bauer}",
  title="High resolution time-of-flight low energy ion scattering",
  journal="Nuclear Instruments and Methods in Physics Research B",
  year="2005",
  volume="230",
  number="0",
  pages="398--401",
  issn="0168-583X"
}