Detail publikace
Study of Thermal stability of Ultrafine-grained Copper by means of Electron Back Scattering Diffraction
MAN, O. PANTĚLEJEV, L. KUNZ, L.
Originální název
Study of Thermal stability of Ultrafine-grained Copper by means of Electron Back Scattering Diffraction
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
Thermal stability of ultrafine-grained (UFG) structure of 99.9% pure copper produced by eight equal channel angular pressing (ECAP) passes was studied. The annealing experiments were conducted at 180degC in a tube furnace under argon as a covering gas. The dwell times were in the range of 10 min to 120 min. The electron backscattering diffraction (EBSD) analyses were performed before and after annealing at exactly the same area in order to quantify the degree of decomposition of the UFG structure. Definition of grain boundaries was based on the misorientation angle of 1. More advanced analysis of the EBSD results based on a kernel average misorientation (KAM) parameter was performed. Inverse pole figure maps with included grain networks did not reveal any substantial changes of UFG microstructure due to annealing. Some shift in the KAM modus in comparison with the initial state was observed but its magnitude was found negligible. Also changes in texture were found to be minor. On the other hand the microhardness increases with increasing time of annealing.
Klíčová slova
ultra-fine grained copper, thermal stability of microstructure, EBSD, grain size, texture
Autoři
MAN, O.; PANTĚLEJEV, L.; KUNZ, L.
Rok RIV
2010
Vydáno
25. 1. 2010
Nakladatel
The Japan Institute of Metals
Místo
Japonsko
ISSN
1345-9678
Periodikum
MATERIALS TRANSACTIONS
Ročník
51
Číslo
2
Stát
Japonsko
Strany od
209
Strany do
213
Strany počet
5
BibTex
@article{BUT48360,
author="Ondřej {Man} and Libor {Pantělejev} and Ludvík {Kunz}",
title="Study of Thermal stability of Ultrafine-grained Copper by means of Electron Back Scattering Diffraction",
journal="MATERIALS TRANSACTIONS",
year="2010",
volume="51",
number="2",
pages="209--213",
issn="1345-9678"
}