Detail publikace

Analysis of surface morphology of plasma polymer films using atomic force microscopy

TRIVEDI, R. ČECH, V.

Originální název

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

For thin polymer films, the surface roughness is one of the very important properties, which affects many other properties such as wettability, adhesion, friction etc. The present work describes the analysis of surface roughness of plasma polymer films of vinyltriethoxysilane and tetravinylsilane by atomic force microscopy. The films of different thickness were prepared at constant deposition conditions and the surface roughness was greatly influenced by the film thickness variation in case of vinyltriethoxysilane. An influence of RF power, used for film deposition of tetravinylsilane, on the surface roughness was observed for films of the same thickness.

Klíčová slova

Plasma polymerization, surface morphology, atomic force microscopy

Autoři

TRIVEDI, R.; ČECH, V.

Rok RIV

2007

Vydáno

13. 12. 2007

Strany od

121

Strany do

124

Strany počet

BibTex

@inproceedings{BUT28340,
  author="Rutul Rajendra {Trivedi} and Vladimír {Čech}",
  title="Analysis of surface morphology of plasma polymer films using atomic force microscopy",
  booktitle="Juniormat 07",
  year="2007",
  pages="121--124"
}