Detail publikace

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

SCHMIEDOVÁ, V. POSPÍŠIL, J. ZMEŠKAL, O. VRETENÁR, V.

Originální název

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

Typ

článek v časopise ve Scopus, Jsc

Jazyk

angličtina

Originální abstrakt

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

Klíčová slova

Graphene Oxide, Optical Properties, Spectroscopic Ellipsometry

Autoři

SCHMIEDOVÁ, V.; POSPÍŠIL, J.; ZMEŠKAL, O.; VRETENÁR, V.

Vydáno

1. 4. 2016

ISBN

978-3-03835-780-3

Kniha

Applied Chemistry in Solving of Production Goals

Číslo edice

851

ISSN

0255-5476

Periodikum

Materials Science Forum

Číslo

851

Stát

Švýcarská konfederace

Strany od

199

Strany do

204

Strany počet

5

URL

https://www.scientific.net/MSF.851.199

BibTex

@article{BUT123404,
  author="Veronika {Schmiedová} and Jan {Pospíšil} and Oldřich {Zmeškal} and Viliam {Vretenár}",
  title="Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry",
  journal="Materials Science Forum",
  year="2016",
  number="851",
  pages="199--204",
  doi="10.4028/www.scientific.net/MSF.851.199",
  issn="0255-5476",
  url="https://www.scientific.net/MSF.851.199"
}